发明名称 METHOD AND DEVICE FOR REDUCING ADHESION OF BY-PRODUCT IN WAFER WORKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for reducing the adhesion of by-products. SOLUTION: A chamber (12) having an inner wall (17) in the periphery is prepd. and is charged with a semiconductor wafer, thereby, a ring (46) is set to inside the chamber closely to the inner wall in the periphery, and moreover, plural reactant gases (22) are introduced into the chamber and reacted, and furthermore, the heated gases are introduced into the chamber through the ring close to the inner wall in the periphery to raise the temp. of the inner wall in the periphery.
申请公布号 JP2000054136(A) 申请公布日期 2000.02.22
申请号 JP19990204708 申请日期 1999.07.19
申请人 TEXAS INSTR INC <TI> 发明人 HWANG MING-JANG;HOSODA KEIZO;AOYAMA SHINTARO;TERASAKI TADASHI;TAMARU TSUYOSHI
分类号 C23C16/44;(IPC1-7):C23C16/44 主分类号 C23C16/44
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