发明名称 |
OPTICAL WAVEGUIDE PROBE, ITS MANUFACTURE, AND SCANNING NEAR-FIELD ATOMIC FORCE MICROSCOPE USING SAME OPTICAL WAVEGUIDE PROBE |
摘要 |
PROBLEM TO BE SOLVED: To provide superior volume productivity, to obtain a uniform shape at low cost, and to set a high resonance frequency and a low spring constant. SOLUTION: An optical waveguide probe 100 has a structure in which a probe base 2 is laminated and formed on a probe holding plate 1 formed of resin. A probe 3 is in a hook shape protruding along the surface of the lamination, and an optical waveguide 4 is formed from the probe base 2 along the edge part of the probe 3. An opening part 5 is formed at the tip of the optical waveguide 4. The opposite-side end part is a light incident part 6. The optical waveguide 4 has a structure in which a core 42 to transmit light is laminated and patterned on base cladding 41 and in which upper cladding 43 is formed so as to cover the core 42.
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申请公布号 |
JP2000046717(A) |
申请公布日期 |
2000.02.18 |
申请号 |
JP19980216752 |
申请日期 |
1998.07.31 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
ARAOGI MASATAKA;ARAWA TAKASHI;KATO KENJI |
分类号 |
G01B11/30;G01N37/00;G01Q60/22;G01Q60/38;(IPC1-7):G01N13/16;G01N13/14 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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