发明名称 OPTICAL WAVEGUIDE PROBE, ITS MANUFACTURE, AND SCANNING NEAR-FIELD ATOMIC FORCE MICROSCOPE USING SAME OPTICAL WAVEGUIDE PROBE
摘要 PROBLEM TO BE SOLVED: To provide superior volume productivity, to obtain a uniform shape at low cost, and to set a high resonance frequency and a low spring constant. SOLUTION: An optical waveguide probe 100 has a structure in which a probe base 2 is laminated and formed on a probe holding plate 1 formed of resin. A probe 3 is in a hook shape protruding along the surface of the lamination, and an optical waveguide 4 is formed from the probe base 2 along the edge part of the probe 3. An opening part 5 is formed at the tip of the optical waveguide 4. The opposite-side end part is a light incident part 6. The optical waveguide 4 has a structure in which a core 42 to transmit light is laminated and patterned on base cladding 41 and in which upper cladding 43 is formed so as to cover the core 42.
申请公布号 JP2000046717(A) 申请公布日期 2000.02.18
申请号 JP19980216752 申请日期 1998.07.31
申请人 SEIKO INSTRUMENTS INC 发明人 ARAOGI MASATAKA;ARAWA TAKASHI;KATO KENJI
分类号 G01B11/30;G01N37/00;G01Q60/22;G01Q60/38;(IPC1-7):G01N13/16;G01N13/14 主分类号 G01B11/30
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