发明名称 |
X-RAY INSPECTION METHOD AND APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a more enhanced result in relation to the data of an element to be detected in X-ray detection. SOLUTION: Two kinds of X-ray transmission data obtained by irradiating a sample 3 to be measured with monochromatic X-raysλ1 having a wavelength shorter than that of the absorption end of the element to be detected in the sample 3 to be measured and monochromatic X-raysλ2 of a longer wavelength are defferentiated by utilizing that the absorption coefficient of an element is largely different before and after the absorption end of the element to obtain the X-ray transmission coefficient only of the element to be detected in the sample to be measured.</p> |
申请公布号 |
JP2000046759(A) |
申请公布日期 |
2000.02.18 |
申请号 |
JP19980210832 |
申请日期 |
1998.07.27 |
申请人 |
JAPAN SCIENCE & TECHNOLOGY CORP;MATSUBARA EIICHIRO;MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MATSUBARA EIICHIRO;KAWASHIMA TSUTOMU;NISHIKI NAOMI |
分类号 |
G01N23/04;G01N23/06;G01V5/00;(IPC1-7):G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|