发明名称 X-RAY INSPECTION METHOD AND APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To obtain a more enhanced result in relation to the data of an element to be detected in X-ray detection. SOLUTION: Two kinds of X-ray transmission data obtained by irradiating a sample 3 to be measured with monochromatic X-raysλ1 having a wavelength shorter than that of the absorption end of the element to be detected in the sample 3 to be measured and monochromatic X-raysλ2 of a longer wavelength are defferentiated by utilizing that the absorption coefficient of an element is largely different before and after the absorption end of the element to obtain the X-ray transmission coefficient only of the element to be detected in the sample to be measured.</p>
申请公布号 JP2000046759(A) 申请公布日期 2000.02.18
申请号 JP19980210832 申请日期 1998.07.27
申请人 JAPAN SCIENCE & TECHNOLOGY CORP;MATSUBARA EIICHIRO;MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUBARA EIICHIRO;KAWASHIMA TSUTOMU;NISHIKI NAOMI
分类号 G01N23/04;G01N23/06;G01V5/00;(IPC1-7):G01N23/04 主分类号 G01N23/04
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