发明名称 CIRCUIT DEVICE HAVING OVERLOAD EVALUATING DEVICE DIRECTED IN CHARACTERISTIC CURVE
摘要 PROBLEM TO BE SOLVED: To supply currently standardized data regarding the loaded states and load resisting ability of a circuit device to an overlapped control system, by supplying a current breaking threshold to the overlapped control system, while the circuit device is operated in an on-line state. SOLUTION: When a control signal has a high level, the plus output current flowing out of the circuit branch of a circuit device corresponds to a high signal, and an IGBT is triggered then. In such a circuit state, a bottom free wheeling diode or top transistor can be in a conductive state. Consequently, the polarity of the output circuit (iac) of the circuit device is decided with respect to the selection from the top transistor and bottom free wheeling diode as a currently active element. When the top transistor is triggered at the same time as when the positive output current flows through, the current flows through the transistor and the free wheeling diode is interrupted.
申请公布号 JP2000050633(A) 申请公布日期 2000.02.18
申请号 JP19990152571 申请日期 1999.05.31
申请人 SEMIKRON ELEKTRON GMBH 发明人 SCHIMANEK ERNST;BILLMANN MARKUS
分类号 H02M7/12;H02M1/00;H03K17/08;H03K17/082 主分类号 H02M7/12
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