发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To improve latch up resistance and punch-through resistance in an epitaxial wafer. SOLUTION: A first region and a second region, which are different in thickness, are installed in a p- epitaxial layer 3a formed on the main face of a p+ silicon substrate 1a. A p-well 5 is formed in the first region whose thickness is relatively small, and an n-well 4 is formed in the second region whose thickness is relatively large. A pMOS transistor is formed on the n-well 4, and an nMOS transistor is formed on the p-well 5.
申请公布号 JP2000049237(A) 申请公布日期 2000.02.18
申请号 JP19980212783 申请日期 1998.07.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 ISHIDA MASAHIRO
分类号 H01L21/761;H01L21/74;H01L21/8238;H01L21/8244;H01L27/092;H01L27/11;(IPC1-7):H01L21/823 主分类号 H01L21/761
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