| 摘要 |
PROBLEM TO BE SOLVED: To provide a conduction tester for electronic part excellent in general purpose performance of socket board for an IC to be tested. SOLUTION: The conduction tester for electronic part comprises a socket board 51 having a plurality of terminals being connected electrically with all terminals of an IC to be tested, a matrix scanner 521 being connected electrically with all terminals of the socket board 51, a power supply 522 for supplying current to the matrix scanner, a voltage detector 524 for detecting the voltage between both poles of the matrix scanner, and a CPU 523 performing the switching control of measuring channels of the matrix scanner.
|
