发明名称 Lightwave conductor strain gauge strip system for measuring mechanical strain uses LWL-DMS on or in the surface of object to measure testing object
摘要 The light wave conductor-strain gauge strip system is fixed on or in the surface of the measurement object to be tested. The measurement system uses lightwave conductors (LWL) or optical structures. The measuring of the mechanical strain results across a mechanical-optical reciprocal action. The LWL-DMS is disturbance-proof against electromagnetic radiations.
申请公布号 DE19755739(A1) 申请公布日期 2000.02.17
申请号 DE19971055739 申请日期 1997.12.16
申请人 WIEBE, PETER 发明人 WIEBE, PETER
分类号 G01B11/16;(IPC1-7):G01B11/16 主分类号 G01B11/16
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