发明名称 |
Floating gate, for a semiconductor device such as a flash-EPROM, is produced by applying a conformal dielectric layer and a conductive layer onto an asymmetrical V-shaped trench |
摘要 |
Floating gate production, by applying a conformal dielectric layer and a conductive layer onto a V-shaped trench, is new. Production of a floating gate on an IC substrate comprises: (a) producing a trench which forms a tip in the substrate; (b) producing a dielectric layer which conforms with the trench; (c) depositing a conductive layer which fills the trench; and (d) etching the conductive layer to define a floating gate, the lower part of which is contained in the trench. Independent claims are also included for the following: (i) a method of producing a semiconductor device on an IC substrate, involving carrying out the above process; (ii) a method of producing an electrically programmable and erasable memory device on an IC substrate comprising forming a device pair, each of which is formed by the above method; (iii) a floating gate formed on an IC substrate by the above process; (iv) semiconductor devices produced by method (i); and electrically programmable and erasable memory devices produced by method (ii).
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申请公布号 |
DE19937912(A1) |
申请公布日期 |
2000.02.17 |
申请号 |
DE19991037912 |
申请日期 |
1999.08.11 |
申请人 |
NATIONAL SEMICONDUCTOR CORP., SANTA CLARA |
发明人 |
KALNITSKY, ALEXANDER;BERGEMONT, ALBERT |
分类号 |
H01L21/334;H01L21/336;H01L21/8247;(IPC1-7):H01L21/336;H01L21/824;H01L27/115 |
主分类号 |
H01L21/334 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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