发明名称 Verfahren und Vorrichtung zum Kalibrieren von emissivitätsunabhängigen Temperaturmessungen
摘要 The invention relates to a method or device for calibrating temperature measurements that are carried out using at least one first radiation detector in order to measure one heat radiation emitted by at least one substrate. Said method consists of the following steps: at least one reference substrate carrying at least one material with a known melting point temperature is heated; the thermal radiation of the reference substrate is measured during heating and/or cooling following said heating; a measured value plateau occurring during the measuring process is compared with the known melting point temperature. A device for carrying out the inventive method is also disclosed.
申请公布号 DE19934299(A1) 申请公布日期 2000.02.17
申请号 DE19991034299 申请日期 1999.07.21
申请人 STEAG AST ELEKTRONIK GMBH 发明人 HAUF, MARKUS;LERCH, WILFRIED
分类号 G01J5/06;(IPC1-7):G01J5/06 主分类号 G01J5/06
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