| 摘要 |
<p>The invention relates to an X-ray examination apparatus which includes an X-ray filter for locally attenuating the X-ray beam. The X-ray filter includes a plurality of filter elements. The X-ray absorption of a filter element is adjusted by way of the quantity of X-ray absorbing liquid present in the filter element. The filling of the filter element is adjusted by means of an electric voltage. In addition to the X-ray absorbing liquid, the filter element contains a second liquid which is present at an interface between the X-ray absorbing liquid and the filter element, said second liquid being chemically inert relative to the X-ray absorbing liquid and having an electrical conductivity which deviates from that of the first liquid.</p> |
