CIRCUIT WITH INTERCONNECT TEST UNIT AND A METHOD OF TESTING INTERCONNECTS BETWEEN A FIRST AND A SECOND ELECTRONIC CIRCUIT
摘要
An electronic circuit comprises a plurality of input/output (I/O) nodes for connecting the electronic circuit to a further electronic circuit via interconnects. A main unit implements a normal mode function of the electronic circuit. A test unit tests the interconnects. The electronic circuit has a normal mode in which the I/O nodes are logically connected to the main unit and a test mode in which the I/O nodes are logically connected to the test unit. In the test mode the test unit is operable as a low complexity memory via the I/O nodes.
申请公布号
EP0979418(A2)
申请公布日期
2000.02.16
申请号
EP19990901802
申请日期
1999.01.29
申请人
KONINKLIJKE PHILIPS ELECTRONICS N.V.
发明人
DE JONG, FRANCISCUS G., M.;MURIS, MATHIAS N., M.;RAAYMAKERS, ROBERTUS M., W.;LOUSBERG, GUILLAUME E., A.