Semiconductor memory device with a test circuit,申请号EP19930107367-传众专利搜索

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发明名称	Semiconductor memory device with a test circuit
摘要
申请公布号	EP0569014(B1)	申请公布日期	2000.02.16
申请号	EP19930107367	申请日期	1993.05.06
申请人	KABUSHIKI KAISHA TOSHIBA;TOSHIBA MICRO-ELECTRONICS CORPORATION	发明人	KOZUKA, EIJI;MIYAWAKI, NAOKAZU
分类号	G01R31/28;G11C11/401;G11C29/26;G11C29/48;H01L21/66;H01L27/10;(IPC1-7):G11C29/00	主分类号	G01R31/28
代理机构		代理人
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