| 摘要 |
The invention relates to a method for measuring an electric voltage (U) while utilizing the longitudinal and the transversal Pockels effects. According to the invention, at least one first and at least one second linear-polarized light beam (10 or 12a, b) is injected into a Pockels crystal (2). Said light beams spread out perpendicular to one another in the Pockels crystal (2). The length of the light path of the first light beam (10) is measured in the Pockels crystal (2) such that, within a predetermined measurement range, a one to one relationship exists between the first intensity, said intensity being measured behind a first analyzer (26), and the voltage (U). This is used for selecting a definite measurement value for the voltage (U) from the second intensity which is measured behind a second analyzer (22a, b) and which is periodically dependent on the voltage (U) within the measurement range. It is thus possible to precisely measure high voltages also when high direct voltage portions are present. |
