| 摘要 |
An X-ray fluorescence analyzing apparatus is formed of an X-ray tube, plural X-ray spectroscopes disposed around a line linking between the X-ray tube and a place where a sample is placed, and first and second slit plates. The first slit plate has at least one first slit therein and is situated at an incident side of the X-ray spectroscopes. The second slit plate has at least one second slit therein, and is situated at an ejection side of the X-ray spectroscopes. X-rays radiated from the X-ray tube enter into the predetermined X-ray spectroscope through the first slit plate and then pass through the second slit plate, so that a sample is irradiated by predetermined X-ray wavelengths. The sample can be radiated by different X-ray wavelengths by selecting the slits of the first and second slit plates.
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