发明名称 SEMICONDUCTOR DEVICE AND AUTOMATIC WIRING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To decrease the capacity between the neighboring wirings on the same layer by using the second wiring grid having the grid interval more than the first wiring grid constituting a logic element, when automatic wiring between the logic elements is performed. SOLUTION: A second grid 14 for the wiring between logic elements, having the twice the grid interval of the first wiring grid 13 determined for the wiring 12 in the logic element constituting a logic element 11, is determined. By setting the the wiring interval for connecting the logic elements large in this way, the increase in the capacity between the signal wiring can be suppressed since the inter-wiring distance can be kept largely, even if signal wirings 17 and 18 connected to signal pins 15 and 16 in the logic element are laid out on the neighboring grids. Furthermore, for the design of the multilayered wiring layer, the capacity between the wiring can be greatly decreased by defining the second wiring grid 14 for every wiring layer.
申请公布号 JP2000040744(A) 申请公布日期 2000.02.08
申请号 JP19980208406 申请日期 1998.07.23
申请人 SEIKO EPSON CORP 发明人 ITO SATOSHI
分类号 H01L21/822;H01L21/82;H01L27/04;(IPC1-7):H01L21/82 主分类号 H01L21/822
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