发明名称 PROBING CARD
摘要 PROBLEM TO BE SOLVED: To provide a probing card in which the pitch of contact pins can be made narrow and in which the contact pins can be replaced individually and simply when they are deformed or broken. SOLUTION: In a probing card, many through holes 4 are made in a guide block 3 which is installed at a printed-circuit board 1, and contact pins 5 which are connected to interconnections on the printed-circuit board 1 are inserted into, and passed through, the through holes 4. Parts which are inserted into, and passed through, the through holes 4 of the contact pins 5 are formed of coiled springs 6. In addition, parts which are derived from the through holes 4 are formed of straight pins 8 which are continued integrally to the coiled springs 6.
申请公布号 JP2000039447(A) 申请公布日期 2000.02.08
申请号 JP19980207886 申请日期 1998.07.23
申请人 TOKYO ELECTRON LTD 发明人 YAMASAKA CHIKAHITO
分类号 G01R1/073;H01L21/66;(IPC1-7):G01R1/073 主分类号 G01R1/073
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