| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a non-volatile semiconductor memory device with which useless write cycles is eliminated and the write time is shortened. SOLUTION: In the case that program verifying is performed, if it is passed in step S3, the write is to be finished, and if it failed, flag discrimination of a flag indicating a distribution state of failure is performed in step S7. Next, flags are classified in steps S8-S12, and quadripartite write (S13) to unipartite write (S16) are performed based on this classification. Thereby, when failure is less in all bits or failure is unevenly distributed, an useless write cycle can be efficiently eliminated.</p> |
