发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To enable a functional test to be carried out for a circuit having three or more different levels of output voltage with an LSI tester, without changing its VOH (high test level) and VOL (low test level). SOLUTION: A parallel/series conversion means 3 receives signals, in parallel from a circuit block 1 through an input terminal 9 and outputs signals in series to an output terminal 11 through an input terminal 10. The parallel/series conversion means 3 has two different levels of output voltage, and a functional test for the circuit block 1 can be carried out without resetting an LSI tester for VOH and VOL. With this setup, a few functional tests that are carried out for a circuit block changing the setting of VOH and VOL of an LSI tester need not be carried out, and the testing time can be shortened.
申请公布号 JP2000040787(A) 申请公布日期 2000.02.08
申请号 JP19980208417 申请日期 1998.07.23
申请人 SEIKO EPSON CORP 发明人 FUKAYA NORIFUMI
分类号 H01L21/822;H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L21/822
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