| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory which can select a memory mat being able to reduce current consumption at the time of burn-in test. SOLUTION: This semiconductor memory is provided with a memory cell array divided into plural memory mats, a memory mat selecting circuit 71 selecting a memory mat to be activated, and a burn-in test mode detecting circuit 76 generating a burn-in test mode detecting signal BI being made an active state when a burn-in test is performed. The memory mat selecting circuit 71 performs selecting operation so that the number of memory mats activated at the time performing a burn-in test is less than the number of memory mats activated at normal operation in accordance with the signal BI.
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