发明名称 FORMING METHOD OF SOI SUBSTRATE AND PORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a means for forming a very thin single crystalline semiconductor thin film. SOLUTION: A single crystalline silicon substrate 101 is anodized, and a porous silicon layer 102 is formed. After that, thermal treatment process at 900-1200 deg.C is performed in an reducing atmosphere. By this thermal treatment process, surface holes of the porous silicon layer 102 are covered, and a thin single crystalline silicon layer 103 is formed in the vicinity of the surface. The single crystalline silicon layer 103 is used as an active layer of an TFT(thin film transistor).
申请公布号 JP2000040812(A) 申请公布日期 2000.02.08
申请号 JP19980205998 申请日期 1998.07.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;FUKUNAGA KENJI
分类号 H01L27/12;H01L21/02;(IPC1-7):H01L27/12 主分类号 H01L27/12
代理机构 代理人
主权项
地址