发明名称 ANALOG DIGITAL CONVERTER AND DIGITAL ANALOG CONVERTER TEST DEVICE
摘要 PURPOSE: A test device is provided to be able to test easily with a logic tester without purchasing options separately when an analog/digital converter and a digital/analog converter are tested. CONSTITUTION: The digital/analog converter test device comprises; three electric power sources such as VRH(Voltage Reference High) generator, VRL(Voltage Reference Low) generator and AIN(analog in); a digital/analog converter to convert an analog inputted voltage generating part into a memory, the waveform data stored in the memory into analog volume and generate a lamp voltage or a waveform. In this way, at the time of testing an analog/digital converter and a digital/analog converter, it can be done without getting an optional program separately.
申请公布号 KR20000007225(A) 申请公布日期 2000.02.07
申请号 KR19980026436 申请日期 1998.07.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, HEE YOUNG
分类号 H03M1/10;(IPC1-7):H03M1/10 主分类号 H03M1/10
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