发明名称 |
INTEGRATED CIRCUIT PACKAGE LEAD TESTING APPARATUS AND METHOD |
摘要 |
PURPOSE: An integrated circuit package lead testing apparatus is provided to test leads of an integrated circuit package exactly. CONSTITUTION: The integrated circuit package lead testing apparatus comprises:a rail(251), wherein an integrated circuit package(271) is transferred on the rail; a stop device(227) for stopping the integrated circuit package on the rail; a guard cover(261) for blocking top and both sides of the rail in order for the package not to go out from the rail; a camera for checking an external appearance of leads of the package; a first control device(225) installed at one side of the rail, for closely sticking the integrated circuit package to the guard cover at the other side of the rail; a second control device(325) installed at the other side of the rail, for closely sticking the integrated circuit package to a guard cover at the one side of the rail.
|
申请公布号 |
KR20000008366(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980028154 |
申请日期 |
1998.07.13 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
SONG, JOO IN;OH, EUN SE;KIM, IN SIK;SEON, YONG HYUN |
分类号 |
G01B13/02;G01B13/16;(IPC1-7):G01B13/02 |
主分类号 |
G01B13/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|