发明名称 INTEGRATED CIRCUIT PACKAGE LEAD TESTING APPARATUS AND METHOD
摘要 PURPOSE: An integrated circuit package lead testing apparatus is provided to test leads of an integrated circuit package exactly. CONSTITUTION: The integrated circuit package lead testing apparatus comprises:a rail(251), wherein an integrated circuit package(271) is transferred on the rail; a stop device(227) for stopping the integrated circuit package on the rail; a guard cover(261) for blocking top and both sides of the rail in order for the package not to go out from the rail; a camera for checking an external appearance of leads of the package; a first control device(225) installed at one side of the rail, for closely sticking the integrated circuit package to the guard cover at the other side of the rail; a second control device(325) installed at the other side of the rail, for closely sticking the integrated circuit package to a guard cover at the one side of the rail.
申请公布号 KR20000008366(A) 申请公布日期 2000.02.07
申请号 KR19980028154 申请日期 1998.07.13
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 SONG, JOO IN;OH, EUN SE;KIM, IN SIK;SEON, YONG HYUN
分类号 G01B13/02;G01B13/16;(IPC1-7):G01B13/02 主分类号 G01B13/02
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