发明名称 FABRICATING METHOD OF EEPROM
摘要 PURPOSE: A method of fabricating an EEPROM(electrically erasable and programmable read only memory) is provided to prevent a tinning phenomenon by forming a lower voltage gate oxide layer using a wet etching process. CONSTITUTION: The method comprises the steps of nitrifying a semiconductor substrate in which a high voltage gate insulating layer and a tunnel insulating layer are formed; sequentially forming a floating gate electrode and an insulating layer on an overall surface of the semiconductor substrate, wherein the insulating layer is composed of multiple layers; sequentially etching the insulating layer, the floating gate electrode layer, and the high voltage gate insulating layer down to a top surface of the semiconductor substrate of a low voltage region using a mask exposing an only low voltage region; forming a low voltage gate insulating layer on the semiconductor substrate of the low voltage region using a wet etching process; and forming a control gate electrode layer on an overall surface of the semiconductor substrate.
申请公布号 KR20000007533(A) 申请公布日期 2000.02.07
申请号 KR19980026911 申请日期 1998.07.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, TAE GWANG;SIM, BYEONG SEOP
分类号 H01L27/10;(IPC1-7):H01L27/10 主分类号 H01L27/10
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