发明名称 SPIN SCRUBBER APPARATUS
摘要 PURPOSE: A spin scrubber apparatus is provided to remove foreign material on a wafer or flatten a surface of the wafer. CONSTITUTION: The apparatus comprises a wafer supporter(100) upon which a wafer(108) is placed; a deionized wafer injector(102) injecting a deionized wafer; a brush(106) for removing particles on the wafer(108) or flattening a surface of the wafer(108); a brush supporter(104); and an auto spacing setting device(110) automatically controlling a spacing between the wafer(108) and the brush(106). An electric circuit unit, automatically controlling the spacing, is mounted between the brush supporter(104) and the wafer supporter(100). The spacing is controlled by a capacitance value between the wafer supporter(100) and the electric circuit unit.
申请公布号 KR20000008123(A) 申请公布日期 2000.02.07
申请号 KR19980027805 申请日期 1998.07.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYEON TAE
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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