发明名称 MONITOR TEST ZIG
摘要 PURPOSE: A monitor test zig is provided to prevent an occurrence of failures, especially a ground failure, during a assembly process. CONSTITUTION: The monitor test zig comprises: a case having a front control panel; a test plate for supporting an up or down function in the case and for mounting a board on an upper face of the test plate, which is laid on an upper face of the case; driving means for controlling the up or down function of the test plate; and a clamping means for fixing the board to test the upper face of the test plate according to the up or down function of the driving means. The driving means includes a rotary lever and rotation means for the function of the up or down of the test plate. The clamping means includes an up/down moving piece connected to the test plate and a fixing unit.
申请公布号 KR20000008642(A) 申请公布日期 2000.02.07
申请号 KR19980028549 申请日期 1998.07.15
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 YANG, DONG JU
分类号 H04N17/00;(IPC1-7):G01R31/26 主分类号 H04N17/00
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