发明名称 |
CAPACITOR OF SEMICONDUCTOR DEVICES AND METHOD THEREOF |
摘要 |
PURPOSE: A capacitor and fabrication method thereof are provided to prevent a chemical reaction and diffusion of impurities between a dielectric layer and a lower electrode by using ALD(atomic layer deposition). CONSTITUTION: The capacitor structure comprises a lower electrode(120) to contact an active region of a semiconductor substrate(100); a dielectric layer(140) having a high dielectric constant formed on the lower electrode using an ALD; an upper electrode(150) formed on the dielectric layer(140), wherein a plurality of inter-layer insulator(130) are formed between the lower electrode(120) and the dielectric layer(140) so as to restrain the chemical reaction and impurity diffusion. The inter-layer insulators(130) composed of a silicon nitride(131) and a silicon oxide(132).
|
申请公布号 |
KR20000008014(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980027657 |
申请日期 |
1998.07.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG MIN;KIM, YOUNG KWAN;LEE, JONG HO;CHOE, SEONG JE |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|