发明名称 CAPACITOR OF SEMICONDUCTOR DEVICES AND METHOD THEREOF
摘要 PURPOSE: A capacitor and fabrication method thereof are provided to prevent a chemical reaction and diffusion of impurities between a dielectric layer and a lower electrode by using ALD(atomic layer deposition). CONSTITUTION: The capacitor structure comprises a lower electrode(120) to contact an active region of a semiconductor substrate(100); a dielectric layer(140) having a high dielectric constant formed on the lower electrode using an ALD; an upper electrode(150) formed on the dielectric layer(140), wherein a plurality of inter-layer insulator(130) are formed between the lower electrode(120) and the dielectric layer(140) so as to restrain the chemical reaction and impurity diffusion. The inter-layer insulators(130) composed of a silicon nitride(131) and a silicon oxide(132).
申请公布号 KR20000008014(A) 申请公布日期 2000.02.07
申请号 KR19980027657 申请日期 1998.07.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG MIN;KIM, YOUNG KWAN;LEE, JONG HO;CHOE, SEONG JE
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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