BOARD FOR TESTING UNIVERSAL SEMICONDUCTOR DEVICE

摘要

PURPOSE: A device for testing a universal semiconductor device is provided to test a merged chip having isolated supply voltage without decreasing the function. CONSTITUTION: The device for testing a universal semiconductor device includes a socket portion(10) and a plurality of port portions(20, 22, 24, 26). The socket portion has holes corresponding pins of a semiconductor having a predetermined package type. The semiconductor device is loaded in the holes. The plurality of ports portion are installed on all sides of the socket portion. A plurality of supply voltage ports for suppling a supply voltage and a plurality of signal ports for receiving signal are properly laid out on the socket portion. A plurality of port portions have a plurality of ports and each port are inserted between a plurality of the supply voltage ports and a plurality of signal ports.