发明名称 |
FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of fabricating a semiconductor device is provided to simplify process steps by excluding a photolithography process for forming a first well isolation region in a triple well forming method. CONSTITUTION: The method comprises the steps of forming a first mask on a first conductive semiconductor substrate to define a first well region; implanting a second conductive impurity ion onto the semiconductor substrate with a large tilt angle ion implanting technique using the first mask to form a first well isolation when the semiconductor substrate reaches a position having a predetermined orient angle during revolution to 360 degree; implanting a first conductive impurity ion reusing the first mask to form a first well to be overlaid on a part of the first well isolation region; implanting a first conductive impurity ion using a second mask for defining the third well region to form a second well at a short distance from the first well; and implanting a second conductive impurity into the semiconductor substrate at both sides of the first and the second wells using a third mask for forming the third well region to form a third well surrounding both sidewalls of the first well.
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申请公布号 |
KR20000007787(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980027298 |
申请日期 |
1998.07.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, JAE JONG;HWANG, DU HYEON;KIM, BYEONG GI;LEE, BYEONG GEUN |
分类号 |
H01L21/266;H01L21/265;H01L21/761;H01L21/82;H01L21/8242;H01L27/108;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/266 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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