发明名称 FABRICATING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of fabricating a semiconductor device is provided to simplify process steps by excluding a photolithography process for forming a first well isolation region in a triple well forming method. CONSTITUTION: The method comprises the steps of forming a first mask on a first conductive semiconductor substrate to define a first well region; implanting a second conductive impurity ion onto the semiconductor substrate with a large tilt angle ion implanting technique using the first mask to form a first well isolation when the semiconductor substrate reaches a position having a predetermined orient angle during revolution to 360 degree; implanting a first conductive impurity ion reusing the first mask to form a first well to be overlaid on a part of the first well isolation region; implanting a first conductive impurity ion using a second mask for defining the third well region to form a second well at a short distance from the first well; and implanting a second conductive impurity into the semiconductor substrate at both sides of the first and the second wells using a third mask for forming the third well region to form a third well surrounding both sidewalls of the first well.
申请公布号 KR20000007787(A) 申请公布日期 2000.02.07
申请号 KR19980027298 申请日期 1998.07.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, JAE JONG;HWANG, DU HYEON;KIM, BYEONG GI;LEE, BYEONG GEUN
分类号 H01L21/266;H01L21/265;H01L21/761;H01L21/82;H01L21/8242;H01L27/108;(IPC1-7):H01L21/82 主分类号 H01L21/266
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