发明名称 |
DIFFUSION FURNACE FOR SEMICONDUCTOR DEVICE FABRICATION |
摘要 |
PURPOSE: A diffusion furnace is provided to fix a thermometer for measuring internal temperature of the diffusion furnace to an exact position therein by forming a position fix rib and a position fix protrusion. CONSTITUTION: The diffusion furnace comprises a furnace made of quartz; a thermometer protection tube fixed to the furnace; a protection rib having a protrusion inserting groove capable of receiving a position fix protrusion in an end of the thermometer protection tube partially protruded to the outside of the furnace; and a thermometer supporter having a position protection protrusion capable of being inserted into the protrusion inserting hole formed on a protection tube rib of the thermometer protection tube.
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申请公布号 |
KR20000008533(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980028401 |
申请日期 |
1998.07.14 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
LEE, GYU CHEOL;PARK, BONG HUI |
分类号 |
H01L21/22;(IPC1-7):H01L21/22 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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