发明名称 DIFFUSION FURNACE FOR SEMICONDUCTOR DEVICE FABRICATION
摘要 PURPOSE: A diffusion furnace is provided to fix a thermometer for measuring internal temperature of the diffusion furnace to an exact position therein by forming a position fix rib and a position fix protrusion. CONSTITUTION: The diffusion furnace comprises a furnace made of quartz; a thermometer protection tube fixed to the furnace; a protection rib having a protrusion inserting groove capable of receiving a position fix protrusion in an end of the thermometer protection tube partially protruded to the outside of the furnace; and a thermometer supporter having a position protection protrusion capable of being inserted into the protrusion inserting hole formed on a protection tube rib of the thermometer protection tube.
申请公布号 KR20000008533(A) 申请公布日期 2000.02.07
申请号 KR19980028401 申请日期 1998.07.14
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 LEE, GYU CHEOL;PARK, BONG HUI
分类号 H01L21/22;(IPC1-7):H01L21/22 主分类号 H01L21/22
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