PURPOSE: A method of fabricating a semiconductor device having a dual gate is provided to prevent impurity ions from trespassing upon a p+ polysilicon gate and sufficiently activate the impurity ions. CONSTITUTION: The method comprises the steps of forming a gate insulating layer and a polysilicon layer on a semiconductor substrate; patterning the polysilicon layer and the gate insulating layer to form a gate; successively implanting a first and a second p-type impurity ions into the exposed substrate at the gate and both sides of the gate; and annealing a substrate of the above structure using a rapid thermal process to form a p-type gate and a source/drain.
申请公布号
KR20000007411(A)
申请公布日期
2000.02.07
申请号
KR19980026745
申请日期
1998.07.03
申请人
HYUNDAI ELECTRONICS IND. CO., LTD.
发明人
CHA, HAN SEOP;LEE, JONG GON;HWANG, JEONG UNG;CHUNG, I SEON;AHN, HUI GYUN;HAN, SANG HYEON;HAN, SANG GYU;KIM, JAE HUI