发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating capacitor is provided to increase capacitance by increasing surface area of a storage node electrode. CONSTITUTION: The method comprises the steps of: forming a contact hole by etching a insulating film and a portion of a substrate; forming a photoresist film in the contact hole; forming a photoresist film with a side wall of a wave shape by photolithography; forming a silicon oxide covering the photoresist film; forming a silicon oxide spacer at the side wall of the photoresist film; removing the photoresist film; forming a storage node electrode in the contact hole between the spacer; and completing the storage node electrode with the shape of a wave by removing the spacer. The another method comprises the additive step of forming a trench in a portion of the storage node electrode.
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申请公布号 |
KR20000008095(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980027766 |
申请日期 |
1998.07.10 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LEE, SU MAN |
分类号 |
H01L27/04;A61K6/00;A61K6/083;A61L24/00;C09J4/00;H01G4/33;H01L21/02;H01L21/70;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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