发明名称 BLOWN FUSE BOX AND SEMICONDUCTOR DEVICE HAVING THE SAME
摘要 PURPOSE: A repairable semiconductor device is provided to minimize an operation speed. CONSTITUTION: The repairable semiconductor device comprises: first and second row decoders(51b, 52b) arranged adjacent to each other, for selecting a row or a column, a first blown fuse(101) arranged in a column direction, for transferring a first input signal corresponding to the first row decoder; and a second blown fuse(102) arranged in a column direction, for transferring a second input signal corresponding to the second row decoder, wherein the first blown fuse and the second blown fuse(101, 102) are arranged in parallel; and wherein the first blown fuse and the second blown fuse(101, 102) are stacked.
申请公布号 KR20000008551(A) 申请公布日期 2000.02.07
申请号 KR19980028423 申请日期 1998.07.14
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 LEE, GYU CHAN;LEE, CHEOL WOO
分类号 H01L21/82;G06F11/20;G11C8/00;G11C29/00;G11C29/04;H01L27/10;(IPC1-7):G11C29/00 主分类号 H01L21/82
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