发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A guard ring is provided to improve reliability of a semiconductor device by preventing damage of an adjacent circuit caused by oxidation of tungsten. CONSTITUTION: The ring comprises a substrate; a first insulating layer formed on the substrate with a contact hole; a node contact layer formed in the middle of the contact hole; a cylindrical first conductive layer formed on a sidewall of a contact hole at both sides of the node contact layer and on the first insulating layer adjacent to the sidewall; a second conductive layer formed on the first insulating layer including the first conductive layer and on the node contact hole with an insulating layer interposed therebetween; a second insulating layer formed on the second conductive layer with a contact hole; a via contact hole formed in the contact hole; and a third conductive layer, coupled to the via contact hole, formed on the second insulating layer.
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申请公布号 |
KR20000007211(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980026415 |
申请日期 |
1998.07.01 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
YANG, DONG HEON;KIM, SHIN HO |
分类号 |
H01L21/82;H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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