发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE: A guard ring is provided to improve reliability of a semiconductor device by preventing damage of an adjacent circuit caused by oxidation of tungsten. CONSTITUTION: The ring comprises a substrate; a first insulating layer formed on the substrate with a contact hole; a node contact layer formed in the middle of the contact hole; a cylindrical first conductive layer formed on a sidewall of a contact hole at both sides of the node contact layer and on the first insulating layer adjacent to the sidewall; a second conductive layer formed on the first insulating layer including the first conductive layer and on the node contact hole with an insulating layer interposed therebetween; a second insulating layer formed on the second conductive layer with a contact hole; a via contact hole formed in the contact hole; and a third conductive layer, coupled to the via contact hole, formed on the second insulating layer.
申请公布号 KR20000007211(A) 申请公布日期 2000.02.07
申请号 KR19980026415 申请日期 1998.07.01
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 YANG, DONG HEON;KIM, SHIN HO
分类号 H01L21/82;H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/82
代理机构 代理人
主权项
地址