X-RAY EXAMINATION APPARATUS WITH A HIGH-RESOLUTION IMAGE SENSOR

摘要

An X-ray examination apparatus comprises an X-ray detector (1) for deriving an optical image from an X-ray image. An image pick-up device (2) derives an image signal from the optical image. The image pick-up device (2) is provided with an image sensor (3, 4) having a plurality of sensor elements. The effective surface area of the sensor elements differs for different optical spectral components of the optical image. The image pick-up device is provided with an adjusting system (8) for selecting an optical spectral component. The image signal is derived from the selected optical spectral component.