IMPROVED ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE,申请号EP19940922723-传众专利搜索

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发明名称	IMPROVED ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE
摘要
申请公布号	EP0753200(B1)	申请公布日期	2000.02.02
申请号	EP19940922723	申请日期	1994.07.25
申请人	PHILIPS ELECTRONICS NORTH AMERICA CORPORATION	发明人	KNOWLES, W., RALPH;SCHULTZ, WILLIAM, G.;ARMSTRONG, ALLEN, E.
分类号	H01J37/18;H01J37/22;H01J37/244;H01J37/256;H01J37/28;(IPC1-7):H01J37/256	主分类号	H01J37/18
代理机构		代理人
主权项
地址

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