| 摘要 |
<p>Method for manufacturing a preparation carrier for use in preparation examination, in particular form-directed examination, such as Atomic Force Microscope (AFM, SFM) examination, wherein: on at least one surface of a carrier base, a layer of plastic is provided, wherein the plastic layer is treated thermally and/or chemically, such that the surface roughness of the side of the plastic that faces the carrier base is reduced, while it substantially does not adhere to the carrier base, whereupon the plastic is removed from the carrier base, with the released, relatively smooth surface of the plastic forming a carrier surface.</p> |
