发明名称 METHOD AND DEVICE FOR PROCESSING PROCESS DATA
摘要 <p>PROBLEM TO BE SOLVED: To process data about the position of each part of a processing object and measured data about the processing state of the processing object by correlating the former with the latter. SOLUTION: A sensor 12 detects the board thickness of metal in a metal manufacturing plant 10 and this detection signal is outputted as measured data to a processor 14. Relating to the operation controller 14 the length of each part from the point of the metal is calculated as position data based on a signal from the sensor 12, also the length of each part from the point of the metal is normalized with the full length of the metal as one, normalized position data are calculated in every processing process, and measured data in every processing process are displayed on a display device 30 corresponding to the respective reference axis while using the normalized position data in every processing process as the respective reference axis.</p>
申请公布号 JP2000035819(A) 申请公布日期 2000.02.02
申请号 JP19980202512 申请日期 1998.07.17
申请人 HITACHI LTD;HITACHI INFORMATION & CONTROL SYSTEMS INC 发明人 FUJIWARA YASUNOBU;KATAYAMA YASUNORI;TAKAHASHI OSAMU;KUROBA TETSUYA;KUMAYAMA HARUYOSHI
分类号 G01B21/08;G01D21/00;G05B23/02;(IPC1-7):G05B23/02 主分类号 G01B21/08
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