DEVICE AND METHOD FOR INSPECTING DRIVING CIRCUIT SUBSTRATE

摘要

PROBLEM TO BE SOLVED: To obtain an inspecting method of a driving circuit substrate in which the inspection time of the substrate is reduced and the cost is reduced. SOLUTION: In the inspecting method, the inspection signal generated by a signal generator 3 is inputted to a driving circuit substrate 1 by an input side probe 2. The driving signal outputted from the substrate 1 in accordance with the inputted inspection signal is supplied to a liquid crystal display panel 8 through an output side probe 4 connected to each output terminal of the substrate 1 as the driving signal of a horizontal scanning side. The inspection is conducted by the condition of the display along with the driving signal generated by a driver circuit 9 provided on the vertical scanning side of the panel 8 by conducting the display in accordance with the inspection signal on the panel 8.