发明名称 Dry or plasma etching with reduction in gas flow during reaction and use of SF4
摘要 <p>A process for dry etching a surface within a vacuum treatment reactor includes evacuating the reactor, generating a glow discharge within said reactor, feeding a reactive etching gas into said reactor and reacting said etching gas within said reactor, removing gas with reaction products of said reacting from said reactor and installing an initial flow of said etching gas into said reactor and reducing said flow after a predetermined time span and during said reacting. The vacuum treatment reactor has a reactor with a pumping arrangement for evacuating the reactor. A glow discharge generating arrangement is connected to an electric power supply. A gas tank arrangement is connected to the reactor and has a reactive etching gas such as SF4.</p>
申请公布号 GB2339553(A) 申请公布日期 2000.02.02
申请号 GB19990009805 申请日期 1999.04.28
申请人 * BALZERS HOCHVAKUUM AG 发明人 EMMANUEL * TURLOT;JACQUES * SCHMITT;PHILIPPE * GROUSSET
分类号 H01L21/302;C23C16/44;C23F4/00;H01L21/00;H01L21/3065;H05H1/46;(IPC1-7):H01L21/306;H01J37/32 主分类号 H01L21/302
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