| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe sharpening method capable of arbitrarily forming the taper angle of the leading end of a probe for STM(scanning tunnel microscope), AFM(atomic force microscope) and SNOM(scanning near field optical microscope). SOLUTION: In a method for producing a probe of which the leading end is sharpened by immersing a part of a probe material 1 in a container 4 containing at least a two-liquid layer containing an etching soln. 2 for the probe material 1 and a non-etching soln. 3 having specific gravity smaller than that of the etching soln. 2 and not mixed with the etching soln. 2, the position in the height direction of the probe material 1 is finely moved during etching to arbitrarily form the taper shape of the leading end of a probe. |
