Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays

摘要

An array of optical fiber bundles includes one or more diffractive elements positioned above gaps between adjacent bundles. Incident radiation produces mathematically determinative diffraction patterns on the respective input faces of the adjacent bundles. Radiation intensity values for areas between and along the abutting edges of adjacent optical fiber bundles can be determined using the diffraction patterns. These intensity values can be assigned to other pixels so that precise, seamless images can be reconstructed.