发明名称 Method of manufacturing a thin film transistor with reduced parasitic capacitance and reduced feed-through voltage
摘要 A method of producing an improved thin film transistor structure is provided having no source/gate or drain/gate overlap. A laser-assisted doping technique is applied to fabricate such transistors. A radiation filter is employed, which is transparent to light at the photolithography wavelength, but reflective or opaque at the laser wavelength. Eliminating source/gate and drain/gate overlap significantly reduces or eliminates parasitic capacitance and feed-through voltage between source and gate. Short-channel a-Si:H thin film transistors may be obtained having high field effect mobilities. Improved pixel performance and pixel-to-pixel uniformity is provided.
申请公布号 US6020223(A) 申请公布日期 2000.02.01
申请号 US19970959590 申请日期 1997.10.29
申请人 XEROX CORPORATION 发明人 MEI, PING;LUJAN, RENE A.;BOYCE, JAMES B.;CHUA, CHRISTOPHER L.;HACK, MICHAEL G.
分类号 H01L21/223;H01L21/225;H01L21/266;H01L21/336;H01L27/144;H01L27/146;H01L29/786;H01L31/0216;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/223
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