发明名称 Bidirectional scanning circuit
摘要 A bidirectional scanning circuit can avoid malfunction of a signal and phase shift of the scanning pulse between IC chips. A rightward shifting input circuit and a leftward shifting output circuit are provided between a series connection point of series connected transfer gates and a first input/output terminal, and a rightward shifting output circuit and a leftward input circuit are provided between the series connection point and the second input/output terminal. By this, influence of the floating capacitors added to both ends of the series connected transfer gate group can be avoided to successfully prevent malfunction of the signal. Also, by connecting the first and second input/output terminals to input/output terminals of other IC chip, respectively, a high speed bidirectional scanning circuit can be established without causing phase shift of the scanning pulses between the chips by cascade connection of a plurality of IC chips.
申请公布号 US6020871(A) 申请公布日期 2000.02.01
申请号 US19970977058 申请日期 1997.11.25
申请人 NEC CORPORATION 发明人 ASADA, HIDEKI
分类号 G02F1/133;G09G3/20;G09G3/36;G11C19/28;H04N5/66;(IPC1-7):G09G3/36 主分类号 G02F1/133
代理机构 代理人
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