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发明名称
SEMICONDUCTOR TEST APPARATUS
摘要
申请公布号
KR100244510(B1)
申请公布日期
2000.02.01
申请号
KR19970073459
申请日期
1997.12.24
申请人
HYUNDAI MICRO ELECTRONICS CO.,LTD.
发明人
CHUN, JUN-HYUN
分类号
G01R31/26;H01L21/66;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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