发明名称 NON-CONTACT THICKNESS MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To simplify a structure, to reduce manufacturing costs, and to accurately measure thickness. SOLUTION: A non-contact thickness measuring device is provided with an arm part 4, light reflection type sensor 3, control means 5, and output means. The arm part 4 is constituted turnably to a vertical direction. The light reflection type sensor 3 is provided at the top end part of the arm part 4. The control means 5 calculates thickness D of a metallic board 1, based on the detection signal of the light reflection type sensor 3. That is, the control means 5 calculates the turning amounts of the arm part 4 in a time from the start to the end of the reception of a reflected wave by the optical reflection type sensor 3. Then, the thickness D of the metallic board 1 is calculated, based on the turning amounts. The output means outputs a measured result obtained by the control means 5.
申请公布号 JP2000028327(A) 申请公布日期 2000.01.28
申请号 JP19980212014 申请日期 1998.07.13
申请人 USC CORP;USC TRADING:KK 发明人 SAKAI YASUHIRO;KANEDA FUMIO
分类号 G01B11/06;(IPC1-7):G01B11/06 主分类号 G01B11/06
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