| 摘要 |
PROBLEM TO BE SOLVED: To provide a time domain reflection factor meter-testing device that is easy to manufacture, is inexpensive, and can test a matching impedance test point. SOLUTION: An x-y prober 16 is used, where it is provided with a first prober head 30 that is located at the upper portion of a printed wiring circuit board 4 and is connected a time domain reflection factor meter through a coaxial test cable and a second prober head 32. The signal prober is mounted to one of the prober heads. A test cable 46 includes a signal wire 48, that is electrically connected to a signal probe 34 and a grounding shield 52 that is electrically connected to a grounding shield extender 62 which is provided around the signal probe. The grounding probe is provided with a grounding spring 68 that is connected to the second prober head 32 and temporarily makes contact with the grounding shield extender for transferring the grounding signal to the grounding shield of the test cable.
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