| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe card for zero insertion force connector type IC tester superior in electrical characteristics. SOLUTION: This probe card 2 for IC tester has one major surface arranged with a plurality of pin-like contacts 211 coming into electrical contact with an object to be tested and connected electrically with the test head substrate 11 of an IC tester. One 22a of a plurality of zero insertion force connectors which are connected electrically with the pin-like contacts 211 is located at a substantially radial position from the position where the pin-like contact is provided.
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