| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which can be surely judged defective when a semiconductor chip is chipped. SOLUTION: A wiring 11 is formed on the periphery of a finalized chip 10, and a detection signal generating circuit 12 and an enabling signal generating circuit 13 are provided. The detection signal generating circuit 12 feeds a detection signal ZENF to the wiring 11. The enabling signal generating circuit 13 generates an enabling signal EN of L-level when the circuit 13 receives no detection signal ZENF. An input buffer 14 and an output buffer 16 are stopped when they receive the enabling signal EN of L level.
|
