发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE AND MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a flat-spin-on-glass layer with superior productivity on the surface of a semiconductor substrate having irregularities. SOLUTION: In this manufacturing method, spin-on-glass, which is applied on the surface of a substrate having irregularities formed on a semiconductor substrate, is baked and flattened, the spin-on-glass is formed thick at the recessed part of the irregularities, and the spin-on glass is formed thin on the protruding part of the irregularities. At his time, a first-stage roller (81) is at 150±50 deg.C, second-stage (82) is at 250±50 deg.C, a third-stage roller (83) is at 300±50 deg.C, a fourth-stage roller (84) is at 350±70 deg.C, a fifth-stage roller (85) is at 350±70 deg.C, and a sixth-stage roller (86) is at 350±70 deg.C. The constitution is such that the intervals between the rollers from the first stage to the sixth stage become gradually narrow.
申请公布号 JP2000031138(A) 申请公布日期 2000.01.28
申请号 JP19980194853 申请日期 1998.07.09
申请人 SEIKO EPSON CORP 发明人 TSUCHIDA TOMOAKI
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
代理机构 代理人
主权项
地址