| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor storage device permitting to improve a yield and a relief rate in wafer test. SOLUTION: A semiconductor storage which has plural power supply boosting circuits 3a, 3b for supplying boosting power supplies VPP1, VPP2 individually for each block of plural word lines to row decoders 2 which select plural word lines WL arranged in a memory cell array 1 at the same time, is provided with a transmission gate 4 and a fuse 5 which are arranged between the plural power supply boosting circuits 3a, 3b and controls switch on-off the boosting power supplies according to the operation modes.
|
